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Thickness measurements of thin films by multiple-beam interferometry /

机译：多光束干涉法测量薄膜厚度/

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Bartlett, T. W.; Ball, Frances L.; Carbide and Carbon Chemicals Corporation.; U.S. Atomic Energy Commission.; Union Carbide Corporation.; Carbide and Carbon Chemicals Company.;
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年度 1954
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8. Measurement of the Thickness of Thin Films by Multiple Beam Interferometry [R] . Pappas, D. 1962

机译：多光束干涉法测量薄膜厚度

Thickness measurements of thin films by multiple-beam interferometry /

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